Enquire Now

Scanning Electron Microscope (SEM)/EDS-WDS combined system

MANUFACTURER FEI/Oxford University
MODEL Quanta 200 electron microscope combined with the Inca X sight and analyser system
TRAINING Training is required to use this item and we can arrange this if needed.
Enquire about this item
SITE City Campus West

Description

The Quanta 200 SEM accommodates a widest range of specimens of any SEM, making it the perfect research partner for labs that process a variety of samples or need to characterize specimens that would be challenging for most conventional SEMs. Quanta features three operating modes — high vacuum, low vacuum and environmental SEM (ESEM) —to allow characterization of samples in their natural states, without the need for coatings or other preparation, giving you a picture of the true structure and composition. The platform offers configurations for samples large and small, with a large range of analytical attachment. The system is equipped with external analytical systems from Oxford instruments (INCA X-sight and analyser), such as energy dispersive spectrometer, wavelength dispersive x-ray spectroscopy and electron backscatter diffraction.

Specification

Resolution • High-vacuum

• Low-vacuum

• Extended vacuum mode (ESEM)

• Accelerating voltage: 200V – 30kV • Probe current: up to 2?A – continuously adjustable. Detectors • Everhardt-Thornley SED • Low-vacuum SED (LFD) • Gaseous SED (GSED) • IR-CCD • Solid-state BSED • Gaseous analytical BSED (GAD)* Chamber • 284mm left to right • 10mm analytical WD • 8 ports • EDX take-off angle: 35° Max sample size: 5x5 cm2 The analytical system for the compositional analysis: Oxford Instruments INCA X-sight LN2 EDS (Energy Dispersive Spectroscopy) X-ray detector: Si(Li) detector, 10mm ATW2, specified energy resolution at 5.9 keV: 133eV

Item ID #393.

Last Updated: 30th October, 2015